Thin ferroelectric films of Ba0.5Sr0.5TiO3, grown on various substrates (Sp, LaAlO3 polycor) using Rf spattering technology, were studied using spectroscopic methods (IR absorption, Raman scattering, second harmonic generation). The actual properties of these films (thickness, rate of grows temperature dependence of order parameter e.a.) were obtained.
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A. M. Pugachev
A. V. Tumarkin
Bulletin of the Russian Academy of Sciences Physics
Russian Academy of Sciences
Institute of Automation and Electrometry
Saint Petersburg State Electrotechnical University
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Pugachev et al. (Mon,) studied this question.
synapsesocial.com/papers/69a7662ebadf0bb9e87dc019 — DOI: https://doi.org/10.1134/s1062873825714758
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