Recent advances in X-ray microscopy instrumentation developments at NSLS-II

X-ray microscopy is a mature characterization tool routinely used to investigate diverse material questions of science, technology, and engineering. The high penetration power of X-rays allows the utilization of different characterization methods and reveals elemental composition, crystalline phases, strain distribution, oxidation states, etc. in macroscopic and microscopic samples. Full-field and scanning X-ray microscopes serve similar scientific purposes but prvoide technical capabilities that complement each other. In recent years, a number of X-ray microscopy systems have been designed, constructed, and commissioned at NSLS-II. During the presentation, we will provide a technical overview of recently designed microscopy instruments. It will include the design details of the Multilayer Laue Lens-based nanoprobe optimized for ~10 nm spatial resolution imaging, its current status, and future upgrades*, ** ; the zoneplate-based full-field imaging system capable of 1-minute nano-tomography measurements*** ; and a new Kirkpatrick-Baez based scanning microscope designed for ~200 nm spatial resolution experiments ****.