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Testing complex manufacturing systems, like the ASML TWINSCAN 2 lithographic, takes a lot of time and costs. Within the Tangram project, are investigated to reduce this test costs. In this article, we describe method which is used to optimize a test sequence such that it takes the least of costs, or time. With several cases we demonstrate that this method be used to optimize test sequences within the manufacturing of a TWINSCAN machine such that cycle time is reduced.
Berglas et al. (Sun,) studied this question.
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