Defect Detection in SEM Images of Nanofibrous Materials

Nanoproducts represent a potential growing sector and nanofibrous materials are widely requested in industrial, medical, and environmental applications. Unfortunately, the production processes at the nanoscale are difficult to control and nanoproducts often exhibit localized defects that impair their functional properties. Therefore, defect detection is a particularly important feature in smart-manufacturing systems to raise alerts as soon as defects exceed a given tolerance level and to design production processes that both optimize the physical properties and control the defectiveness of the produced materials. Here, we present a novel solution to detect defects in nanofibrous materials by analyzing scanning electron microscope images. We employ an algorithm that learns, during a training phase, a model yielding sparse representations of the structures that characterize correctly produced nanofiborus materials. Defects are then detected by analyzing each patch of an input image and extracting features that quantitatively assess whether the patch conforms or not to the learned model. The proposed solution has been successfully validated over 45 images acquired from samples produced by a prototype electrospinning machine. The low computational times indicate that the proposed solution can be effectively adopted in a monitoring system for industrial production.