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January 1, 2004Journal of Analytical Atomic Spectrometry

In situ interferometric depth and topography monitoring in LIBS elemental profiling of multi-layer structures

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DPD. G. PapazoglouVPVassilis PapadakisDADemetrios Anglos

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Papazoglou et al. (2004) studied this question.

synapsesocial.com/papers/6a1258478793652519a5eeb6https://doi.org/10.1039/b315657e
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