United Microelectronics (Taiwan)

Recent papers from United Microelectronics (Taiwan)

1. Modal Verification and Structural Strength Analysis of an Autonomous Bus ChassisSensors and Materials · 2026
2. DC , Small Signal and Noise Analysis of Graded‐ AlGaN /ε‐Ga2O3 Barrier GaN HEMT on β‐Ga2O3 Substrate for LNAsInternational Journal of Numerical Modelling Electronic Networks Devices and Fields · 2026
3. Efficiency-Based CLLC Bidirectional DC-DC Converter Using Copolar SwitchingEnergies · 2026
4. Alditols in complex with boronophenylalanine for improving aqueous solubility for boron neutron capture therapyRSC Pharmaceutics · 2025
5. High Power Added Efficiency Enhancement-Mode Γ-Gate RF HEMT With High/Low p-GaN Doping ProfileIEEE Journal of the Electron Devices Society · 2025
6. LithoHoD: A Litho Simulator-Powered Framework for IC Layout Hotspot DetectionIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2024
7. Single-Mode VCSELs With Zn-Diffusion Apertures for Applications in Co-Packaged Optics SystemsIEEE Journal of Selected Topics in Quantum Electronics · 2024
8. Effect of phase correction produced by trimming layer on thin-film bulk acoustic resonatorJournal of Applied Physics · 2024
9. Addressing practical challenges of LiB cells in their pack applicationsScientific Reports · 2024
10. Investigation of Creep Failure in Ag-4Pd Bonding Wire Under Dynamic Mechanical Analysis TestsIEEE Transactions on Components Packaging and Manufacturing Technology · 2023
11. Adjusted Iterated Greedy for the optimization of additive manufacturing scheduling problemsExpert Systems with Applications · 2022
12. Significance of Overdrive Voltage in the Analysis of Short-Channel Behaviors of n-FinFET DevicesIEEE Journal of the Electron Devices Society · 2022
13. Evaluation of stability and robustness of poly-Si resistors with different dopant concentrationsJapanese Journal of Applied Physics · 2021
14. Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology NodesIEEE Electron Device Letters · 2021
15. A Wide-Range All-Digital Delay-Locked Loop for DDR1–DDR5 ApplicationsIEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2021
16. Performance Improvement of Co-Sputtering AlGaZnO Solar-Blind PhotodetectorsIEEE Sensors Journal · 2021
17. A Study of the Nonlinear Capacitance Variation in Inter Level Copper and Low-k Interconnect StructureIEEE Transactions on Device and Materials Reliability · 2021
18. Big data analytics energy-saving strategies for air compressors in the semiconductor industry – an empirical studyInternational Journal of Production Research · 2021
19. From IC Layout to Die Photograph: A CNN-Based Data-Driven ApproachIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2020
20. Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETsIEEE Transactions on Electron Devices · 2020