Temperature induced bandgap tuning and structural evolution in electrochemically deposited nanocrystalline mgs thin films

Key Points

• The research aims to investigate how varying precursor temperatures affect the structural properties and bandgap of magnesium sulfide thin films.
• Synthesis of MgS thin films via electrochemical deposition at different temperatures.
• Characterization of the structural properties using X ray diffraction (XRD).
• Analysis of diffraction peaks to determine crystallinity and structural evolution.
• The XRD analysis confirmed the polycrystalline nature of MgS thin films.
• Distinct diffraction peaks were observed, corresponding to specific crystallographic planes.
• Structural differences were noted between MgS films deposited at varying temperatures.