September 15, 1963

NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE

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Abstract

Views Icon Views Article contents Figures NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE. Appl. Phys. Lett. 15 September 1963; 3 (6): 96–97. https://doi.org/10.1063/1.1753887 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search

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Paul Handler (Sun,) studied this question.

synapsesocial.com/papers/6a0ccd4ba4d785ea81625b05 https://doi.org/https://doi.org/10.1063/1.1753887