NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE

Paul Handler

doi:10.1063/1.1753887

September 15, 1963Applied Physics Letters

NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE

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Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Paul Handler; NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE. Appl. Phys. Lett. 15 September 1963; 3 (6): 96–97. https://doi.org/10.1063/1.1753887 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search

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synapsesocial.com/papers/6a0ccd4ba4d785ea81625b05 https://doi.org/10.1063/1.1753887

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NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE

Abstract

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NEW METHOD FOR THE MEASUREMENT OF SURFACE ELECTRICAL CONDUCTIVITY OF Si AND Ge BY CLEAVAGE

Abstract

Discussion

Cite This Study

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