This chapter demonstrates innovative nano-imaging techniques in elemental measurement, suggesting new applications in geology.
This chapter (Nano‐Imaging for Advanced X‐ray Fluorescence and Absorption Spectroscopy Applications) is a contribution to the Geostandards and Geoanalytical Research Handbook of Rock and Mineral Analysis – an online textbook that is a fully revised and updated edition of A Handbook of Silicate Rock Analysis (P. J. Potts, 1987, Blackie, Glasgow). Chapter 16 (from Section 3 of the handbook devoted to microbeam techniques) has been designed to provide a coherent progression, starting with a brief introduction of the essential fundamentals and the practical information needed to understand the experimental specifics of nano‐XRF imaging. This concise yet crucial information is followed by a comprehensive presentation of current applications of nano‐XRF imaging, with examples showcasing elemental measurement and XAS applications based on nano‐XRF imaging. To conclude, the final section offers a brief overview of emerging perspectives that should be of particular interest to young researchers at the beginning of their careers.
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Simionovici et al. (2025) studied this question.
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