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Critical analysis of noise measurement methods in thermal imagers highlights issues affecting reproducibility.
This paper presents a review of reasons that create metrological chaos in the field of characterization of noise in thermal imagers. In detail, the paper presents a critical review of myriads of past and presentday definitions/measurement methods of noise parameters of thermal imagers that create this chaos and significantly reduce reproducibility of measurement of noise parameters carried out by different test teams.
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Krzysztof Chrzanowski (2025) studied this question.
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