Operando and in situ analysis of interfaces in advanced materials, revealing oxidation behaviors under varying conditions.
Innovative approaches to study buried interfaces and heterogeneous interactions under reaction conditions are crucial for advancing energy and catalytic materials. Our near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) setup is equipped with a tricolor x-ray source, with Al Kα, Ag Lα, and Cr Kα excitation energies, enabling information depth–selective operando and in situ analysis of solid-liquid, solid-gas, and solid-solid interfaces. We present three case studies to demonstrate the systems’ capabilities. First, we compare experimental depth profiling of a LaMnO 3 /LaFeO 3 /Nb:SrTiO 3 multilayer with SESSA (simulation of electron spectra for surface analysis) simulations. Second, we examine the oxidation and reduction of Fe x O y as a function of environment and temperature. Last, the Pt/liquid electrolyte interface is examined, revealing surface oxidation in the absence of bulk oxidation. As our results confirm, the unique combination of a NAP-XPS with the tricolor x-ray source empowers laboratory-based in situ and operando XPS characterization of advanced materials under reaction conditions in a wide range of applications.
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Bosch et al. (2025) studied this question.
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