Analysis elaborates on testing methods for sensitivity and time precision parameters in Geiger-mode and linear avalanche photodiode detectors, indicating their significance in optoelectronic technology.
With the rapid development of optoelectronic technology, Geiger-Mode Avalanche Photodiode Detectors (G-APD) and Linear Avalanche Photodiode Detectors (L-APD) demonstrate significant potential in fields such as weak light detection and high time precision detection. To ensure that these detectors meet practical application requirements, this paper elaborates on the testing methods for single-photon level sensitivity parameters and high time precision detection parameters of Geiger-Mode and Linear Avalanche Photodiode Focal Plane Detectors. It also discusses the application and validation of these methods in actual testing. Through systematic analysis of testing principles, procedures, and data processing methods, this paper provides a scientific basis for performance evaluation of relevant detectors and is of great significance in promoting the development of optoelectronic detection technology.
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Lu et al. (2025) studied this question.
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