Precision Measurement of Few Charges in Cavity Optomechanical Coupled to an Atomic Ensemble System

Enhancing and controlling optomechanically induced higher‐order sideband generation is essential to achieve high‐sensitivity sensing. This study theoretically explores the amplified charge‐dependent generation of optical second‐order sidebands (OSS) within a cavity optomechanical system, facilitated by an atomic ensemble. Findings reveal that the presence of an atomic ensemble not only enhances OSS generation but also shows a more pronounced charge dependence in the output OSS spectrum compared to a single optomechanical cavity system. This enhancement inspires to explore charge measurements with higher sensitivity. The results demonstrate that the sensitivity of charge measurement can be elevated by over four orders of magnitude when additional atomic ensembles are incorporated. The proposed scheme presents a promising approach for charge measurement and holds significant potential for applications in quantum sensing.