Shadow moiré profilometry optimization through lateral shifting

Shadow moiré is a widely recognized and well-established technique for three-dimensional measurement, based on the analysis of light and shadow fringe patterns. These patterns are obtained by placing a physical grid over the study surface or projecting structured light. Traditional techniques produce phase-shifting by displacing the grid vertically or by adjusting the light source position, which generates frequency deviations. While the method is highly sensitive, these frequency deviations introduce errors in the 3D profile estimation. To address this limitation, our research group proposes a method that achieves shadow-moiré measurements without frequency deviation. This method is able to perform a lateral shift (not vertical) on fringe patterns, obtaining high sensitivity and precision of the profile estimation.