Experimental measurement reveals tenfold intensity enhancement of tunable X-rays in bulk van der Waals materials, breaking previous assumptions about thin films.
We experimentally measure free-electron-driven tunable X-rays from bulk van der Waals crystals, breaking the notion that these signatures are observable only from thin films, and showing that intensity enhancements of up to tenfold are possible.
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Zhai et al. (2025) studied this question.
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