Unveiling Light Within Photonic Integrated Circuits by Nonlinear Near-field Optical Microscopy

Q: What type of study is this?

This is a Quantitative Study study.

Matan Iluz; Kobi Cohen; Jacob Kheireddine; Yoav Hazan; Amir Rosenthal; Shai Tsesses; Guy Bartal

doi:10.1364/cleo_fs.2025.ff147_8

January 1, 2025

Unveiling Light Within Photonic Integrated Circuits by Nonlinear Near-field Optical Microscopy

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Key Points

The method enables real-time visualization of light propagation in photonic integrated circuits.
Using silicon's nonlinear properties, we achieve non-invasive electric field mapping in these devices.
This technique allows for parameter extraction without interrupting the operation of the circuits.
Understanding light behavior in these circuits could enhance future photonic technologies.

Implication

Method reveals light propagation in photonic integrated circuits, suggesting non-invasive field mapping.

Abstract

We present a method to visualize light propagation in photonic circuits using silicon’s nonlinear properties, which allows real-time, non-invasive electric field mapping and parameter extraction in integrated devices without disrupting their operation.

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Cite This Study

Iluz et al. (2025) studied this question.

synapsesocial.com/papers/68d463f131b076d99fa638eb https://doi.org/10.1364/cleo_fs.2025.ff147_8

View at Publisher

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Unveiling Light Within Photonic Integrated Circuits by Nonlinear Near-field Optical Microscopy

Key Points

Implication

Abstract

Discussion

Cite This Study

Unveiling Light Within Photonic Integrated Circuits by Nonlinear Near-field Optical Microscopy

Key Points

Implication

Abstract

Discussion

Cite This Study

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