Digital Push–Pull Driver Power Supply Topology for Nondestructive Testing

Push–pull switch-mode power supplies are widely employed due to their high efficiency and power density. However, traditional designs typically depend on multiple auxiliary circuits to achieve functions such as power-up control, voltage regulation, and system protection, resulting in structural complexity and difficulty in debugging. Additionally, dual-power high-voltage amplifier systems often suffer from voltage deviations caused by supply imbalances or load fluctuations, potentially leading to equipment failure and significant economic losses. To overcome these limitations, we propose a novel digital signal-controlled push–pull driver power supply topology in this paper. Specifically, this design utilizes digital pulse-width modulation (PWM) signals to control multi-stage metal-oxide-semiconductor field-effect transistors (MOSFETs), incorporating adjustable duty-cycle drives, multi-channel current sensing, and fault protection mechanisms. Experimental validation was performed on a ±220 V, 20 kHz, 180 W power supply prototype. The results demonstrate excellent performance, notably enhancing stability and reliability in dual-side synchronous power supply scenarios. Thus, this digital-control topology effectively addresses the drawbacks of conventional push–pull designs and offers potential applications in nondestructive testing and high-voltage driving systems.