Real-Time Object Classification via Dual-Pixel Measurement

Achieving rapid and accurate object classification holds significant importance in various domains. However, conventional vision-based techniques suffer from several limitations, including high data redundancy and strong dependence on image quality. In this work, we present a high-speed, image-free object classification method based on dual-pixel measurement and normalized central moment invariants. Leveraging the complementary modulation capability of a digital micromirror device (DMD), the proposed system requires only five tailored binary illumination patterns to simultaneously extract geometric features and perform classification. The system can achieve a classification update rate of up to 4.44 kHz, offering significant improvements in both efficiency and accuracy compared to traditional image-based approaches. Numerical simulations verify the robustness of the method under similarity transformations—including translation, scaling, and rotation—while experimental validations further demonstrate reliable performance across diverse object types. This approach enables real-time, low-data throughput, and reconstruction-free classification, offering new potential for optical computing and edge intelligence applications.