Global generation of test ideals in mixed characteristic and applications

Suppose that X is an integral scheme (quasi-)projective over a complete local ring of mixed characteristic. Using ideas of Takamatsu-Yoshikawa and Bhatt-Ma-et. al, we define a notion of a $+$-test ideal on X, including for divisors and linear series. We obtain global generation results in this setting that generalize the well known global generation results obtained via multiplier ideal sheaf techniques in characteristic $0$ and via test ideals in characteristic $p>0$. We also obtain applications to the non-nef locus in mixed characteristic.