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August 14, 2024MicronOpen Access

Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM

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PDPeter DenningerPSPeter SchweizerESErdmann Spiecker

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Denninger et al. (2024) studied this question.

synapsesocial.com/papers/68e5c459b6db64358755ad64https://doi.org/10.1016/j.micron.2024.103703
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