Contact resistance is an umbrella term capturing various current-limiting mechanisms existing at and around metal/semiconductor junctions of an electronic device. Despite its known detrimental impact on the performance of organic, oxide, and 2D semiconductor electronics, a quantitative and predictive description of contact resistance is still lacking. At the same time, recent evidences show that contact resistance can actually provide benefits to certain applications, thus challenging our common belief. This presentation will clarify why contact issues are so critical to the operation of general thin-film systems, and highlight our recent results on re-defining the role of contact resistance in organic diodes and transistors.
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Chang‐Hyun Kim (2024) studied this question.
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