Study of multilevel feature weighted fusion-based image classification method for silicon single crystal growth process

A multi-level feature weighted fusion based image classification method for silicon single crystal growth process has been proposed to address the issue of the long silicon single crystal pulling times at industrial sites, which prevents timely understanding of the crystal growth process. A multi-level feature weighted fusion method was employed to identify and classify the growth process of silicon single crystals. A Czochralski single crystal silicon growth process recognition system was then designed. A comparison of the experimental results obtained from this design with the traditional single image classification method clearly showed that using different levels of silicon single crystal image information simultaneously effectively improved the accuracy of silicon single crystal growth image classification.