The x-ray imaging crystal spectrometer (XICS) for Korea Superconducting Tokamak Advanced Research is applied to measure multiple atomic states, such as Ar16+, Ar17+, W43+, and W44+, with keeping the same spectrometer configuration because all spectra are well separated within the detector boundary. The first experimental results from the recently installed full W tiles in the lower divertor utilizing the XICS are discussed.
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Lee et al. (2024) studied this question.
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