The Internet of Things (IoT) has changed how one uses technology by using many sensors that create large sets of data. The integrity and efficiency of IoT systems are very important for their widespread adoption, and Hardware-in-the-Loop (HIL) testing has emerged as a key tool in nearly achieving this. This research paper offers a brief exploration of HIL testing within the scope of IoT engineering, exploring its practical applications and associated methodologies. This article empirically describes two distinct data processing methods, Method-I and Method-II, providing insights into the adept tradeoff between CPU-intensive algorithms and the efficiency of one-pass processing with Welford's Algorithm. Additionally, the paper introduces an innovative schema-based approach for sensor data storage using both XML and JSON formats, enabling efficient and versatile data storage and retrieval, particularly when guided by Probability Density Functions (PDFs). While XML's verbosity and rigidity are acknowledged, the choice of format is contextual and application-specific. Overall, this research advances our understanding of effective data processing and storage in IoT environments while showcasing the potential of schema-driven, PDF-based data storage, reproduction, and schema design.
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Patnaik et al. (2024) studied this question.
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