Back Cover In article number 2301061, Chen and co-workers report the first attempt to characterize the as-grown quality, defects, and strain of transition metal dichalcogenide (TMDC)-based two-dimensional materials through exciton anisotropy. A simple ellipsometric parameter-based method for observing the anisotropic excitonic behavior in monolayer TMDCs materials is demonstrated. The change in the exciton anisotropy of TMDCs material is superior as the detection indicator.
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Chen et al. (2024) studied this question.
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