This study addressed the importance of evaluating the radio frequency immunity (RFI) absolute level at high-speed interfaces in a smart phone product. In this paper, a practical RF coupling flexible printed circuitry (FPC) design was introduced. It can be adopted to a device under test (DUT) easily, comparing the high-speed RFI level margin across different DUTs. The proposed evaluation method has been tested and results are provided for consideration.
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Jiang et al. (2024) studied this question.
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