Voltage-inductive-heated devices have the characteristics of small heat productivity and low temperature difference, especially for UHV capacitor voltage transformer, abbreviated as CVT, and arrester, which are high and noble. If the temperature difference on the surface of these device changes due to ambient temperature and affects the defect diagnosis result, it may lead to the inability to detect heating defects in a timely manner, endangering the safe and stable operation of the device. Therefore, it is urgently needed to analyze the variation rule and correction method of the surface temperature difference of voltage-inductive-heated devices under the impact of ambient temperature. This article established a three-dimensional temperature field simulation model of UHV CVT and arrester, and calculated the surface temperature difference of CVT and arrester under the impact of ambient temperature. Afterwards, regression analysis was used to obtain the calculation method for surface temperature difference of voltage-inductive-heated devices after ambient temperature correction.
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Baogeng Liu (2024) studied this question.
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