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March 26, 2024MetrologyOpen Access

Statistical Analysis of Measurement Processes Using Multi-Physic Instruments: Insights from Stitched Maps

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CMClément MoreauJLJulie LemesleDMDavid Páez Margarit

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Moreau et al. (2024) studied this question.

synapsesocial.com/papers/68e7253fb6db64358769eb9dhttps://doi.org/10.3390/metrology4020010
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