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March 21, 2024Advanced Control for Applications

CNN‐based defect detection in manufacturing

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Authors

MHMing HouPLPengcheng LiSCShiqi Cheng

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Cite This Study

Hou et al. (2024) studied this question.

synapsesocial.com/papers/68e73191b6db6435876ab32ehttps://doi.org/10.1002/adc2.196
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