Parametric analysis of on-chip III-V/SiN quantum well/dot lasers

A parametric study was conducted on coupled-cavity on-chip lasers to investigate the feasibility of reducing the lasing linewidth. The study showed that the coupled-cavity structure achieved up to 7 orders of magnitude linewidth reduction. Increasing the number of QW/QD layers (or QD density-per-layer) resulted in higher optical power and narrower linewidths. However, in the QW case, increasing the layers reduced efficiency and increased the input-power requirement for locking, while in the QD case, increasing the QD layers/density increased the efficiency and decreased the input-power requirement. The study recommends minimizing the number of QW layers and maximizing the number of QD layers at moderate and low current injection, respectively.