This paper examines experimental measurements of Schottky diodes with different areas under forward bias. The numerical procedure for extracting the reverse saturation current, ideality factor and series resistance is outlined. Obtained results are discussed by evaluating the relative error between the measurements and the model. A fluctuation in the relative error led us to use an alternative extraction method. As a result, we conclude that a nonlinear behavior, which is dependent on the geometry, affects the series resistance of the studied diodes.
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Schiavoni et al. (2024) studied this question.
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