Solution-processed films demonstrate promising piezoelectric properties, suggesting potential in surface haptics.
K0.5Na0.5NbO₃ is among the most promising lead-free piezoelectrics. While its sputtered films match the performance of the champion piezoelectric Pb(Zr,Ti)O₃, reproducible processing of high-quality and time-stable solution-processed K0.5Na0.5NbO₃ films remains challenging. Here, we report 1 $μ$m-thick Mn-doped K0.5Na0.5NbO₃ films prepared through a chemical solution deposition process, which have perfectly dense microstructure and uniform composition across their thickness. The films exhibit a high transverse piezoelectric coefficient (e31,f = -15.4 C/m²), high dielectric permittivity (εᵣ ≈ 920), low dielectric losses (tanδ= 0.05) and can withstand electric fields up to at least 1 MV/cm. The functional properties show excellent stability over time, and the synthesis process is reproducible. Furthermore, a surface acoustic haptic device is demonstrated by using K0.5Na0.5NbO₃ thin-film actuators. The results demonstrate the high potential of Mn-doped K0.5Na0.5NbO₃ films to become a replacement for lead-based Pb(Zr,Ti)O₃ films in piezoelectric applications.
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Alluri et al. (2025) studied this question.
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