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This analysis demonstrates improved fault coverage and reduced testing time in VLSI circuits using genetic algorithms.
VLSI testing is used to improve the reliability of the product. The diagnosis is used to identify the fault in the circuit. In this technique used fault table and genetic algorithm for the diagnosis of the circuit. That extends the speed of testing and fault coverage in the circuit. The benchmark circuits are used for the experiment. Reduce the number of test vector required to diagnose the fault. And increase the fault coverage.
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Chandradurga et al. (2019) studied this question.
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