Abstract Marginally twisted bilayer graphene having small twist angles is predicted to exhibit unique structural and electronic properties, though experimental characterization remains limited. Using scanning tunneling microscopy, we investigate such systems with twist angles of 0.06°–0.35°. AA-stacked regions reveal a pronounced tunneling spectral peak signifying highly localized electronic states. Conversely, AB domains display uniform multiple spectral peaks, indicative of strong lattice reconstruction and enhanced electronic homogeneity. We identify two distinct strain-induced domain walls: one exhibits a sharp −120 meV spectral peak (shear type), while the other shows distinct spectral characteristics (mixed shear-tensile type). Tight-binding calculations verify strain-driven transformations of both domain wall types and confirm direct observation of strain-mediated domain wall transitions. These results elucidate the electronic structure of marginally twisted bilayer graphene and establish strain as a control parameter for domain wall states.
Ouyang et al. (2025) studied this question.