This insight note reveals the importance of x-ray photoelectron spectroscopy and Auger peak analysis in understanding carbon surface chemistry, suggesting refined measurement methodologies.
Understanding the surface chemistry of carbon materials is typically explored using x‐ray photoelectron spectroscopy (XPS). Researchers typically focus on the C(1s) core‐level to deduce chemistry, often overlooking complementary spectral information. This insight note summarizes the use of the x‐ray excited Auger peak for carbon, deriving the D‐parameter to aid in the measurement of sp 2 —sp 3 ratios.
No takes yet. Share an insight, caveat, or question.
Mark A. Isaacs (2025) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: