The proposed method applies two distinct analytical strategies to accurately determine calibration parameters of slanted lenticular lens arrays by considering their asymmetric sampling characteristics along different axes. In the vertical direction, where sampling is sufficient, direct spatial analysis is performed, while in the horizontal direction, where aliasing occurs, beat-frequency analysis is employed. By intentionally generating and analyzing undersampled low-frequency patterns, the lens pitch can be determined with subpixel precision. Experiments conducted on a commercial 4K multi-view display demonstrate angular accuracy of 0.004° and spatial accuracy of 0.00028 pixels, confirming highly precise parameter estimation. Consequently, crosstalk in reconstructed 3D images is significantly reduced, and the proposed approach enables accurate calibration without iterative optimization or distortion correction.
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Jeon et al. (2025) studied this question.
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