Excellent X-band EMI shielding efficiency from engineered silver telluride (Ag2Te) nanoparticles

Herein, we present one-pot synthesis of aniline mediated and 2-mercaptoethanol (2-ME) capped silver telluride (Ag2Te) nanoparticles (NPs) via a solvothermal approach. Aniline and 2-ME play decisive role in reducing the precursor salts in-situ and for subsequent formation of stochiometric Ag2Te NPs of about 18–35 nm dimension, as confirmed by powder X-ray diffraction (XRD) measurement. Formation of silver nano-particles (Ag NPs) in absence of 2-ME was established in one of the experiments by observing surface plasmon resonance (SPR) at about 380 nm. Raman spectroscopy showed characteristic vibration of Te-O lower than 200 cm−1 hinting possible redox reaction on the surface. Differential scanning calorimetry (DSC) analysis showed phase change at 147 ºC. Similarly, presence of organics was understood by thermogravimetric analysis (TGA) which showed mass loss of about 5.0 %. Furthermore, morphology and surface topography of the so-synthesized Ag2Te NPs was studied by field emission scanning electron microscopy (FESEM), high-resolution transmission electron microscopy (HRTEM) and atomic force microscopy (AFM). The fabricated Ag/Ag2Te/PVA nanocomposite films showed excellent electrical conductivity to the tune of 887.4 S cm−1. The present finding are believed to be the first ever report on electromagnetic shielding interference (EMI) using silver telluride. EMI was recorded using vector network analyser (VNA) and the Ag/Ag2Te/PVA nanocomposite film showed maximum absorption dominating (-50.49) shielding effectiveness of about − 65.5 dB with effective absorption (Aeff) of about 100 %.