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Demonstrates a scan-less imaging system that maps birefringence in materials, indicating its potential for detailed optical analysis.
This study presents a spectroscopic polarimetric imaging system that integrates single-pixel imaging (SPI) with dual-comb spectroscopic polarimetry (DCSP) to achieve scan-less birefringence mapping. The system simultaneously captures amplitude and phase spectra for two orthogonal polarizations using DCSP, while SPI eliminates the need for mechanical scanning through structured illumination with a spatial light modulator. Experimental validation using a USAF 1951 birefringent test chart demonstrated successful reconstruction of spectral-resolved images of amplitude ratio and phase difference, achieving high contrast and effectively resolving coated patterns.
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Tanimura et al. (2025) studied this question.
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