Long-term drift of a bandgap voltage reference by molding compound oxidation during extended thermal aging

Key Points

• Voltage references exhibit drift over long-term thermal aging, driven significantly by molding compound oxidation.
• The study found a notable voltage change of 20 mV after 1000 hours at 125°C due to oxidation effects.
• Analysis of thermal aging under accelerated conditions was performed to evaluate voltage reference stability across various environments.
• These findings highlight the need for enhanced material stability to improve the reliability of electronic components under thermal stress.