The authors demonstrate a testing system for General Interface Boards, indicating its effectiveness for future production.
The GIB boards (General Interface Boards) and the dedicated crate were designed and realized by a team of the SEA (Servizio Elettronica e Automazione) group of the research division. The main task of these boards is to interface the front-end electronics (FE or transition boards) dedicated to different detectors of KLOE-2 experiment with the higher stages of the acquisition system. The GIBs are equipped with many types of interfaces: optical link, RS232, USB, Ethernet and a 184-pins connector for the crate; the link between the GIBs and the front-end boards is done through the backplane of the crate. About 90 boards were produced and some tests were necessary to discard the broken ones. The toughest is the test of the pins for the crate: so we developed a dedicated system and software in order to accomplish it in a fast and sure way. We wrote this note to show how this system works in the case of a future production of new GIB boards.
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A. et al. (2012) studied this question.
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