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Demonstrates enhanced synaptic linearity and endurance in memristors using baffle system design, indicating significant improvements for neuromorphic computing applications.
Valence change memory (VCM)-based memristors have emerged as promising artificial synapses for neuromorphic computing, yet their nonlinear conductance modulation and limited endurance remain major bottlenecks. Here, we introduce the baffle system concept into HfO₂-based VCM memristors to regulate oxygen vacancy (VO) transport and improve both synaptic linearity and cycling reliability. Guided by a multiscale simulation framework that integrates density functional theory calculations and finite element method-based multiphysics modeling, dual Al₂O₃ interlayers were strategically incorporated as nanoscale barriers within the HfO₂ matrix to modulate VO migration. The appropriately engineered baffle barriers promote lateral filament growth, enhancing synaptic linearity by up to 43%, while simultaneously confining VOs to achieve over a 60× improvement in endurance. The proposed memristive baffle system provides a practical materials design strategy for precise control of ion transport and filament dynamics, contributing to the development of advanced memristive materials and enhancing their feasibility for neuromorphic applications.
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Kim et al. (2026) studied this question.
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