Methodology implements source modeling for CT systems, assessing simulation accuracy without manufacturer data.
Key Points
This research aims to develop a method for simulating x-ray sources in computed tomography systems when manufacturer data is unavailable.
Implemented source modeling combining x-ray spectra and attenuation profiles using CdTe spectrometry and ionization chamber measurements.
Created basic (Single-spectrum) and complex (Multi-spectra) models for simulations in GATE 10.
Evaluated source models by comparing simulations to measurements of half-value layers and CT dose index across different voltages.
Single-spectrum and Multi-spectra models showed a mean difference of 4% compared to measurements.
CTDI values from Multi-spectra sources were within 7% of measured values, outperforming other models.
Single-spectrum model agreed with measurements (<10%) but underestimated doses by up to 16%, while the manufacturer's data had the largest discrepancies.