Probabilistic model predicts threshold transitions in dielectric breakdown data, suggesting superior interpretability.
We introduce the Delta-Gate formalism, a probabilistic model defined on the logarithmic scale distance Δ = log₁₀(X/X_cr), with transition probability P(R=1|X) = σ(wΔ − τ). In the limit w → ∞, the model recovers the classical hard-threshold rule as a special case. Empirical illustration using LDPE dielectric breakdown data (N=60, RMSE 0.046–0.071) shows fit quality comparable to Weibull models with superior physical interpretability.
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Fabio Zander (2026) studied this question.
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