Low-Voltage Electron Microscopy (LVEM) Part III: Enhancing Undergraduate Training and Research Participation

Undergraduate students in science, technology, engineering, and math (STEM) programs are often deprived of hands-on experience with the advanced characterization techniques essential for nanomaterials research. Traditional high-voltage transmission electron microscopy (TEM) systems— the gold standard of electron microscopy (EM)— are costly, complex, and require specialized facilities, which limits their availability at primarily undergraduate institutions (PUIs). Alternative approaches, such as remote and virtual access, provide only limited practical experience. Low-voltage electron microscopy (LVEM) offers a simple, affordable solution suitable for both teaching and research. LVEM gives undergraduates practical EM experience that bridges classroom learning and hands-on characterization.