Novel techniques reveal electronic properties of individual nanostructures, implying enhanced material characterization methods.
Visible light is emitted when electrons (holes) are injected into a sample from the tip of the scanning tunneling microscope STM. The emission spectrum contains information on the properties of the sample immediately below the tip. By analyzing the spectra of the emitted light, one can not only determine the surface geometry by usual STM imaging, but also, by simultaneously measuring the emission spectrum, learn the electronic properties of individual nanostructures.
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S. Ushioda (1996) studied this question.
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