Terahertz-range dielectric and optical behavior of CaMgSi2O6 ceramics

The terahertz range is essential for dielectric and photonic technologies, demanding materials with low loss, stable permittivity and refractive index, and structural integrity. Here the terahertz dielectric and optical response of CaMgSi 2 O 6 ceramics is reported for the first time using terahertz time-domain spectroscopy (THz-TDS). After sintering at various temperatures, phase purity and stability could be confirmed by structural analysis. Sintering at optimum temperature also improved densification, reduced porosity and slightly increased relative permittivity. Sintering at 1280–1320 °C yields relative permittivity of ~6.1–7.8, loss tangent of ~0.0018–0.025, refractive index of 2.47–2.80 and transmittance from 71 to 78% to 3–14% over 0.1–1.5 THz, highlighting CaMgSi 2 O 6 as a promising material for high-performance THz dielectric and photonic devices. • First report on the terahertz dielectric and optical properties of CaMgSi 2 O 6 ceramics using THz-TDS. • Phase-pure and structurally stable CaMgSi 2 O 6 achieved over a wide sintering temperature range. • Optimized sintering enhances densification and reduces porosity. • Low tan δ (0.0018–0.025), ε՛ = 6.1–7.8, refractive index (n) = 2.47–2.80, and strong transmittance at 0.1–1.5 THz.