Demonstrates a novel optical system for luminescence measurement in nanometer areas, suggesting enhancements for microscopy techniques.
We aim at characterizing luminescence from nanometer area by cathode luminescence and photo luminescence measurement with high-spacial resolution using a conductive transparent (CT) probe. The CT probe can inject electrons or photons for excitation in the same nanometer area and detect weak luminescence with high efficiency. In this study, we fabricated an optical system for leading luminescence by the CT probe to a spectrometer and calibrated in advance the system of the spectrometry. We were able to measure Raman spectrum of diamond, indicating the correct operation of the spectrometer and of the optical system. Further, we can complete the new scanning probe microscope system by connecting the optical system to scanning tunneling microscope with the CT probe replaced from a metallic probe.
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Soga et al. (2017) studied this question.
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