This method demonstrates improved 3-D imaging of nanocomposites with similar atomic numbers, suggesting advancements in materials analysis.
A scanning transmission electron microscopy (STEM)-based energy-dispersive X-ray spectroscopy (EDX) tomography method is developed for accurate three-dimensional (3-D) visualization of nanoscale composite microstructures. This approach overcomes the limitations of conventional STEM tomography for microstructures containing crystalline phases with minimal difference in atomic numbers. The STEM-EDX tomography method was utilized to generate reliable 3-D reconstructions of nano-fibrous silicon (average diameter ≈ 30 nm) uniformly embedded in Aluminum matrix—a morphology previously ambiguous in two-dimensional microstructural characterization. Further validation has been done by local atom probe tomography reconstruction.
No takes yet. Share an insight, caveat, or question.
Ghosh et al. (2026) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: