Thinness‐ and Shape‐Controlled Growth for Ultrathin Single‐Crystalline Perovskite Wafers for Mass Production of Superior Photoelectronic Devices

Thinness-controlled perovskite wafers are directly prepared using a geometry-regulated dynamic-flow reaction system. It is found that the wafers are a superior material for photodetectors with a photocurrent response ≈350 times higher than that made of microcrystalline thin films. Moreover, the wafers are compatible with mass production of integrated circuits.